Abstract— The study of crystal structure profile fitting described by Hugo Rietveld named Rietveld Refinement became popular for profile fitting and microstructural analysis. The Rietveld method refines user-selected parameters to minimize the difference between an experimental parameter (observed data) and a model based on the hypothesized crystal structure and instrumental parameters (calculated data). In this paper, profile fitting of CuO has been discussed for different intensities of XRD data. Here Goodness of fitting is kept 1-2. For different dose the goodness of fitting changes.
Keywords— CuO, Powder diffraction, gamma radiation.
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